Advanced In Situ Methods for Materials Characterization
Utrecht, 29 November 2024
Structural characterization of materials down to the atomic scale is essential for understanding properties and performances of materials. The holy grail is to perform at the same time advanced structural and property characterization under realistic dynamic conditions. Recent technological advancements now allow us approaching this holy grail.
Header image: Bart Kooi placing a sample in his transmission electron microscope.
Photo by Leoni von Ristok
In the present (afternoon) workshop the main focus is on the use of structural probes based on electrons, X-rays (lab-based or synchrotron) and neutrons and then perform in-situ or operando dynamical experiments. This for instance allows atomic resolution imaging of nanoscale electronic devices subjected to electrical fields, light driven processes monitored inside the electron microscope, nanoscale catalysts interacting with gases and liquids and operando studies of battery materials.
Programme
Date: Friday, 29 November 2024
Time: 12.00 hours (incl. lunch) - 17.30 hours (incl. drinks)
Venue: De Witte Vosch, Oudegracht 46, Utrecht
Preliminary programme (Pdf file)
More information (incl. titles, abstracts, references) on the programme can be found here
Updates will follow shortly
Confirmed invited speakers
